Techinical Debt

Shun Fujita, Ibuki Nakamura, Tatsuya Shirai, and Riku Kato from our laboratory presented at the Software Engineering Symposium 2024 (SES 2024), held from September 17 to 19, 2024. Nakamura presented in the General Paper Track on the topic, “Towards an Empirical Investigation into Self-Admitted Technical Debt in Test Code”. His research focused on the distribution and types of SATD (Self-Admitted Technical Debt) in test code. He revealed that various types of SATD exist in test code, and certain SATD unique to test code that have not been covered in previous research were identified.

Ms.Watanabe and Mr.Fujita from SDlab presented at SIGSE and Mr.Kano and Mr.Horikawa from SDlab presented at SIGSS, both held on July 25th-27th, 2024 in Hokkaido. Ms. Watanabe presented her paper titled “Investigating the Impact of Shortening Release Cycle on Introduction and Resolution of Self-Admitted Technical Debt”. She discussed the impact of adopting shortened release cycles on SATD, focusing on Eclipse. The analysis revealed that adopting shortened release cycles does not

Mr. Kosei Horikawa and Ms. Miku Watanabe, students in Nara National College of Technology and our collaborators (Internship students), presented their studies at the SIGSS workshop (non-peer-reviewed), held on March 14-15th, 2023 in Okinawa. Mr. Horikawa presented his paper titled “Toward Investigating the Impact of Refactoring on Test Execution Time”. This study explores the frequency, types of test code refactoring, and its impact on test execution time. Ms. Watanabe presented her paper titled “Toward Investigating the Impact of Adopting Rapid Release on Self-Admitted Technical Debt Introductions”.