Ms. Watanabe, Mr.Fujita, Mr.Horikawa, and Mr.Kano presented their papers at the SIGSE/SIGSS workshop in Hokkaido

Ms.Watanabe and Mr.Fujita from SDlab presented at SIGSE and Mr.Kano and Mr.Horikawa from SDlab presented at SIGSS, both held on July 25th-27th, 2024 in Hokkaido.

Ms. Watanabe presented her paper titled “Investigating the Impact of Shortening Release Cycle on Introduction and Resolution of Self-Admitted Technical Debt”. She discussed the impact of adopting shortened release cycles on SATD, focusing on Eclipse. The analysis revealed that adopting shortened release cycles does not have a negative impact from the perspective of SATD.

Shun Fujita presented his paper titled “Towards An Empirical Evaluation of Defect Detection Capability in Snapshot Testing”. He conducted a survey targeting repositories that adopt snapshot testing on GitHub and revealed that snapshot testing can detect defects that other tests cannot detect.

Mr. Horikawa presented his paper titled “Toward Investigating the Impact of Test-Specific Refactoring”. He discussed the frequency, types, and impact of refactoring specific to test code in actual OSS development. The study revealed new findings on test code-specific refactoring, not covered in existing research, and its relationship with test smells (issues that lead to a decline in test quality).

Mr. Kano presented his paper titled “Toward Investigation into the Relationship between Test Quality and Production Code Design”. He discussed the relationship between the design of production code and test quality, investigating at a finer granularity of method-level relationships compared to previous research. The study revealed the co-occurrence of low-quality test methods and low-quality production methods.